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Semiconductor Curve Tracer CS-8000 Series | TOP |

The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN. |
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Explanation of each part

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Features
■ Selectable hardware architecture
You can select any voltage and current unit required for your measurement to suit your application. | |||||||||||||||||||||||
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■HV unit | |||||||||||||||||||||||
The HV unit is a high voltage unit of 2kV and 5kV. DC or PULSE wave can be selected. Also you can select the constant voltage or constant current drive measurement. | |||||||||||||||||||||||
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■MV unit (Common to all main unit) | |||||||||||||||||||||||
The MV unit is a 200V medium voltage unit which you can select the constant voltage or constant current drive measurement. Also you can select DC or PULSE, SINE, Rectified or Half-Rectified waveforms. | |||||||||||||||||||||||
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■GATE unit (Common to all main unit) | |||||||||||||||||||||||
The GATE unit is a 40V unit. You can select the constant voltage or constant current drive measurement. Also DC, PULSE and SINE waveforms can be selected. | |||||||||||||||||||||||
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■HC unit | |||||||||||||||||||||||
Because of the HC unit with the high current mode, high current measurements up to 2kA can be performed. The pulse width, measuring period and measuring range can be varied.. | |||||||||||||||||||||||
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■ Minimum current resolution 250fA
The use of triaxial and the optimization of the measurement system has reduced leakage and noise in the equipment, so the stable measurement of very small currents canbe performed. |
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■ Flexible GATE signal output
The gate signal can be sequenced and applied. Hold Time Time variable range 0.000[s]~ 5.000[s] GATE voltage variable range -40[V] ~ +40[V] |
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■ Hysteresis measurement
CS-8000 is useful for measuring wideband-gap semiconductors such as SiC and GaN with hysteresis.
“Double sweep function” simultaneously displays up sweep and down sweep, allowing for hysteresis observation. |
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You can adjust the amplitude and time to allow any gate pattern input. Also a preliminary signal enables to be applied to the gate. Devices with hysteresis can be measured under multiple conditions. |

■ Configuration for various experiment
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The graphical display of the measurement configuration makes easy to set various settings. |
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The test fixture CS-322 automatically switches the internal matrix switch to match the configuration settings, eliminating the need for a wiring swap. It is also not necessary to switch the connection between HV and HC units manually. Because the internal relay automatically switches through the configuration settings. These functions prevent incorrect wiring during measurement. |

■ UI designed for ease of use
The 12.1 inch Touch Screen, front panel buttons and rotary knob provide intuitive operation. The on-screen keyboard on the screen and the numeric keypad on the front panel allow you to enter settings, limit values, and so on. To enable operation by USB mouse/keyboard. |
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■ Temperature characteristic measurement
Evaluation of temperature characteristics is required for targets used in high and low temperature environments during actual operation. CS-8000 can be used in combination with hotplate and ThermoStream to measure temperature characteristics. The use of ThermoStream requires test fixture and adapters. Automatic measurement is also available with software. |
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Hotplate PA3020 / 3040 / 4030 (non isolation) | |||||||||||||
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Temp. control by external sensor and RS485
400ºC(PA4030) |
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■Sizes of hotplate / power consumption
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Test Fixture for ThermoStream | |||||||||||||
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Enables connection with TermoStream for wide range of temperature measurements. 【Size(mm):Approx.300Wx300Dx200H】 【Power supply : AC adaptor】 |
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Test adaptor for ThermoStream | |||||||||||||
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Adaptors attaching with Test Fixture for ThermoStream. 【Withstanding temperature : -50ºC to 200ºC】 |
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■ Improved on-wafer testing affinity
The output terminals are fitted with noise-resistant triaxial for easy connection to wafer-prober. |
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■ Safety mechanism
― Interlock for safe measurement ― An interlock function is linked to the cover of the fixture. During interlock operation, the output is turned off to avoid the electric shock, and the curve tracer keeps safe measurements. Even when you use the prober or temperature chambers, the curve tracer keeps safe measurement in conjunction with external interlock terminal. The LEDs in main unit and test fixture indicate the state of the interlock. |
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![]() Test fixture |
![]() Main unit |
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- Output limit function - | |
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Voltage, current, and power limits can be set to prevent damage to the target. In addition, the hardware overcurrent protection function shuts off current when 1.4 times the current flow of the measuring range. |
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■ System Configuration
HC units and fixtures can be selected to match the voltage and current of the measuring target. | |||||||||||||||
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■ Accessoriesystem Configuration
■ CS-520 Patch panel
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■ Test adaptors CS-500 series
For use with test fixtures and CS-520 patch panels.
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■ Cable
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