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Application software : CS-810
semiconductor parameter measurement 

Measurement of devices

Multiple devices' measurements and data storages can be performed in a short time.

This software performs tests for multiple measurement items. Operator simply need to input sample name according to the device replacements and connection changes, following the instructions on popups, to repeat measurement under the same conditions. Judgments (Pass/Fail) based on the requirements given will be shown for each measurement, and images and waveforms data also will be stored automatically.

Input sample name and set it to Test Fixture. Displays the measured value and the judgment results during measurement. Pop-up holds the measurement or gives instructions based on the measurement results. Pop-up holds the measurement or gives instructions based on measured items. Logs on the measurement can be exported to CSV file or Excel file afterwards. Logs on Stress test will be saved on separate files. Re-measurement of the selected item can be performed.

Measurement function of circuit modules

This software controls the scanner system as well as the curve tracer. The software also controls open/short and HV/HC. All the measurements for a module can be fully automatically performed without a need for lugging/unplugging.

Configuration on one-circuit can be applied to the other circuit as the application supports copy & paste.