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Application software : CS-810
semiconductor parameter measurement
Test of Discrete devices
| Measurement of multiple devices with one click operation after cabling |
| With CS-810 software option the configuration for one circuit can be easily copied to 10 channels, making it user friendly and fast to iterate the test setup and perform measurements on each circuit. |
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Measurement of wafers
| Devices on wafers can be measured by connecting a probe station system. |
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